Ion Beam Facility
This is a contract result notice, not an open opportunity. Details from the official award data.
This contract is a one-off supply only and has now been awarded.
Dual Beam Focused Ion Beam –Scanning Electron Microscope instrument.
The instrument will be used for the investigation of a wide range of materials, including polymers, metals, ceramics, glasses, composites, semiconductors, nanomaterials, nanostructures and coatings.
For the purposes of this procurement our requirements have been divided into 3 lots as follows:- Lot 1 – Focused Ion Beam Scanning Electron Microscope (FIB SEM) system.
Lot 2 – Cooling system for FIB SEM.
Lot 3 – Energy Dispersive spectroscopy system for FIB SEM.
What the notice asks for
This contract is a one-off supply only
This contract is a one-off supply only and has now been awarded.
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- OCID
- 01e686dd-0015-4d22-be82-fc2342e632f9
- Stage
- contract · Contract
- Source
- Contracts Finder
- Buyer ref
- 200/YE
Contains public sector information licensed under the Open Government Licence v3.0. Source data © Crown copyright.
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