RFQ - Profilometer for sputter crater depth measurement
This is a contract result notice, not an open opportunity. Details from the official award data.
This sits in the lower-middle of the Laboratory & Precision Equipment band — a mid-scale opportunity. Based on 9,869 valued Laboratory & Precision Equipment tenders in our corpus.
NPL requires a stylus profilometer to measure the sputter crater depth for X-ray Photoelectron spectroscopy and secondary ion mass spectrometry metrology work.
Sputter craters are typically in the range of (1000 µm x 1000 µm) to (100 µm x 100 µm) and with depths from 10 µm to 100 nm.
The sample often has high reflectivity (e.g. silver thin film or silicon wafer) and so a stylus profilometer rather than an optical profilometer is required.
Detailed specifications are provided in section 2.2 and 2.3.
In addition to these, high quality profiles will be deemed to have the least spurious spikes or ripples.
The capability for automation and a 3D scan is preferred.
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- OCID
- ec270fc7-1d46-4e92-bcb1-6291a46c4e01
- Stage
- contract · Contract
- Source
- Contracts Finder
- Buyer ref
- tender_465458/1405967
Contains public sector information licensed under the Open Government Licence v3.0. Source data © Crown copyright.
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